The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2019
Filed:
Jan. 26, 2016
Ifp Energies Nouvelles, Rueil-Malmaison, FR;
Maxime Moreaud, Saint Martin la Plaine, FR;
Francois Wahl, Chaponost, FR;
IFP ENERGIES NOUVELLES, Rueil-Malmaison, FR;
Abstract
The invention is a method for the segmentation of an object's image obtained by three-dimensional reconstruction. Based on an object's image represented by a finite number of intensity levels, the image is reconstructed based on projections acquired from different angles around the object, a distribution representative of the spread of the intensity levels in the image along a predetermined direction is determined, for at least one angle. Next, at least one intensity threshold is determined by minimizing an objective function estimating the difference between the actual measurement and a simulated measurement for the angle being considered with the simulated measurement being dependent on the threshold and the distribution. Next, the image is segmented by grouping the intensity levels into at least two classes defined by the threshold. The invention has a particular application to characterization of supports of catalysts for petrochemical refining.