The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2019
Filed:
Jul. 06, 2018
Arevo, Inc., Santa Clara, CA (US);
Saeed Heysiattalab, Santa Clara, CA (US);
Chandrashekar Mantha, Santa Clara, CA (US);
Mohammad Dadkhah Tehrani, San Jose, CA (US);
Michael Peter Thompson, San Carlos, CA (US);
Arevo, Inc., Santa Clara, CA (US);
Abstract
A filament inspection system is disclosed that gathers empirical data on the physical and chemical properties of filament. The illustrative embodiments need only a single video camera and two mirrors to image all of the exterior surfaces of one or more filaments simultaneously. These images can be used to analyze the physical properties of the filament. Furthermore, the illustrative embodiments need only a simple electrical network to gather empirical data on the permittivity of each segment of filament, which gives insights into the chemical properties of the filament. For example, embodiments of the present invention are particularly well suited for inspecting fiber-reinforced thermoplastic filament, and variations in the number, dispersion, wetting, and length of the fibers are all observable in variations in permittivity.