The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2019
Filed:
Sep. 20, 2017
Nec Laboratories America, Inc., Princeton, NJ (US);
Muhammad Zeeshan Zia, San Jose, CA (US);
Quoc-Huy Tran, Santa Clara, CA (US);
Xiang Yu, Mountain View, CA (US);
Manmohan Chandraker, Santa Clara, CA (US);
Chi Li, San Jose, CA (US);
NEC Corporation, Tokyo, JP;
Abstract
A surveillance system and method are provided. The surveillance system includes an image capture device configured to capture an actual image of a target area depicting an object. The surveillance system further includes a processor. The processor is configured to render, based on a set of 3D Computer Aided Design (CAD) models, synthetic images with intermediate shape corresponding concept labels. The processor is further configured to form a multi-layer Convolutional Neural Network (CNN) which jointly models multiple intermediate shape concepts, based on the rendered synthetic images. The processor is also configured to perform an intra-class appearance variation-aware and occlusion-aware 3D object parsing on the actual image by applying the CNN to the actual image to generate an image pair including a 2D and 3D geometric structure of the object depicted in the actual image. The surveillance system further includes a display device configured to display the image pair.