The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2019

Filed:

Mar. 02, 2012
Applicants:

Peng Qiu, Houston, TX (US);

Andrew J. Gentles, San Jose, CA (US);

Sylvia K. Plevritis, Palo Alto, CA (US);

Garry Nolan, Palo Alto, CA (US);

Karen Sachs, Palo Alto, CA (US);

Inventors:

Peng Qiu, Houston, TX (US);

Andrew J. Gentles, San Jose, CA (US);

Sylvia K. Plevritis, Palo Alto, CA (US);

Garry Nolan, Palo Alto, CA (US);

Karen Sachs, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2018.01); G06F 19/20 (2011.01); G06F 19/24 (2011.01); G06F 19/26 (2011.01);
U.S. Cl.
CPC ...
G06F 19/24 (2013.01); G06F 19/20 (2013.01); G06F 19/26 (2013.01);
Abstract

Methods and systems for determining progression and other characteristics of microarray expression levels and similar information, alternatively using a network or communications medium or tangible storage medium or logic processor.


Find Patent Forward Citations

Qiu, Peng. (2019). Spanning-tree progression analysis of density-normalized events (spade) (U.S. Patent No. 10289802). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10289802

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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