The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2019
Filed:
Feb. 04, 2015
Emc Corporation, Hopkinton, MA (US);
David Stephen Reiner, Lexington, MA (US);
Nihar Nanda, Acton, MA (US);
Ron Tozzie, Pittsburgh, PA (US);
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
An apparatus comprises a processing platform configured for integration of compliance and analytic environments. The compliance and analytic environments are implemented at least in part by the processing platform. The processing platform comprises at least a portion of a data lake at least partially shared between the compliance and analytic environments. The processing platform further comprises one or more integration mechanisms supporting interaction between the compliance and analytic environments via the data lake. Such integration mechanisms may include one or more of providing direct access from the analytic environment to the compliance environment, unified indexing across the compliance and analytics environments, tracking data set interrelationships across the compliance and analytic environments, associating event data of the compliance environment with enterprise activity data, movement of indexing artifacts, movement of contextual data, independent scaling of the compliance and analytic environments, and rehosting of data ingestion from the compliance environment to the analytic environment.