The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2019
Filed:
Jun. 23, 2017
New Relic, Inc., San Francisco, CA (US);
Todd West, San Francisco, CA (US);
Graham Fuller, San Francisco, CA (US);
Sebastian Ramirez, Portland, OR (US);
New Relic, Inc., San Francisco, CA (US);
Abstract
A system performs discovery and instrumentation of processes of an application based on process performance. The system includes one or more processors configured to: determine a duration score for a process indicating a relationship between a duration time for the process and a transaction time for a transaction including the process; determine an instrumentation threshold value; determine whether the duration score satisfies the instrumentation threshold value; and in response to determining that the duration score satisfies the instrumentation threshold value, instrument a second process invoked by the process to receive a second duration time for the second process when execution of the second process is detected in a second transaction trace of a second transaction. In some embodiments, the system prunes instrumented processes that primarily invoke subprocesses, and are thus unimportant for performance monitoring.