The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2019
Filed:
Apr. 18, 2017
Nec Laboratories America, Inc., Princeton, NJ (US);
Wei Cheng, Plainsboro, NJ (US);
Kenji Yoshihira, Princeton Junction, NJ (US);
Haifeng Chen, West Windsor, NJ (US);
Guofei Jiang, Princeton, NJ (US);
NEC Corporation, Tokyo, JP;
Abstract
Methods are provided for both single modal and multimodal fault diagnosis. In a method, a fault fingerprint is constructed based on a fault event using an invariant model. A similarity matrix between the fault fingerprint and one or more historical representative fingerprints are derived using dynamic time warping and at least one convolution. A feature vector in a feature subspace for the fault fingerprint is generated. The feature vector includes at least one status of at least one system component during the fault event. A corrective action correlated to the fault fingerprint is determined. The corrective action is initiated on a hardware device to mitigate expected harm to at least one item selected from the group consisting of the hardware device, another hardware device related to the hardware device, and a person related to the hardware device.