The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2019
Filed:
Jun. 01, 2015
Applicant:
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Inventors:
Werner Knebel, Kronau, DE;
Wolfgang Oestreicher, Mannheim, DE;
Assignee:
Leica Microsystems CMS GmbH, Wetzlar, DE;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/10 (2006.01); G02B 21/00 (2006.01); G01N 21/64 (2006.01); G02B 21/36 (2006.01); G02B 21/06 (2006.01); G02B 21/16 (2006.01);
U.S. Cl.
CPC ...
G02B 21/10 (2013.01); G01N 21/6458 (2013.01); G02B 21/002 (2013.01); G02B 21/0032 (2013.01); G02B 21/0076 (2013.01); G02B 21/0084 (2013.01); G02B 21/06 (2013.01); G02B 21/16 (2013.01); G02B 21/361 (2013.01); G02B 21/367 (2013.01);
Abstract
A SPIM-microscope (Selective Plane Imaging Microscopy) having a y-direction illumination light source and a z-direction detection light camera. An x-scanner generates a sequential light sheet by scanning the illumination light beam in the x-direction. By an illumination optics having a zoom optics that is provided in the beam path of the illumination light beam the focal length of the illumination light beam can be varied.