The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2019
Filed:
Jul. 20, 2017
Olympus Corporation, Hachioji-shi, Tokyo, JP;
Yoshihiro Shimada, Sagamihara, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
A light sheet microscope includes an objective, an illumination optical system, a correction device, an image pickup device, a first adjustor, a second adjustor and a controller. The controller performs a first focus process and a spherical aberration correction process. The first focus process is a process in which the first adjustor is controlled on the basis of light that is from the light sheet plane and that is detected via the objective so that the light sheet plane and a focal plane become closer when a relative position between the light sheet plane and a sample has been changed. The spherical aberration correction process is a process in which the correction device is controlled so that an evaluation value of the image obtained by the image pickup device becomes greater when the first adjustor has changed the relative position between the light sheet plane and the objective.