The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2019

Filed:

Sep. 09, 2016
Applicant:

Raytheon Company, Waltham, MA (US);

Inventor:

James M. Bowden, Forney, TX (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 3/48 (2006.01); G01S 3/74 (2006.01); G01S 3/04 (2006.01); G01S 11/02 (2010.01); G01S 3/14 (2006.01);
U.S. Cl.
CPC ...
G01S 3/043 (2013.01); G01S 3/14 (2013.01); G01S 3/48 (2013.01); G01S 3/74 (2013.01); G01S 11/02 (2013.01);
Abstract

In an array antenna having a plurality of subarrays, a direction finding system and technique includes receiving signals at an array antenna and capturing data with a plurality of groups of subarrays. Each group of subarrays may capture data during a selected one of a plurality of different dwell times. The method further includes generating a plurality of dwell spatial sample covariance matrices (SCMs) using data corresponding to one or more of the plurality of groups of subarrays and combining the plurality of dwell spatial SCMs in complex form to generate an aggregate covariance matrix (ACM). The ACM may then be used in subsequent processing with MINDIST technique to estimate a direction of a received signal based on the combined data.


Find Patent Forward Citations

Bowden, James. (2019). Systems and methods for direction finding using augmented spatial sample covariance matrices (U.S. Patent No. 10288715). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10288715

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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