The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2019

Filed:

Aug. 10, 2015
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Tetsuo Kobayashi, Kyoto, JP;

Yosuke Ito, Kyoto, JP;

Sunao Ichihara, Kawasaki, JP;

Natsuhiko Mizutani, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/26 (2006.01);
U.S. Cl.
CPC ...
G01R 33/26 (2013.01);
Abstract

Provided is an optically pumped atomic magnetometer that can separate and acquire magnetic information of spatially different places at the same time by one probe beam. The optically pumped atomic magnetometer includes a cell containing alkali metal atoms, a pump beam optical system introducing pump beams including circularly polarized light component to different locations of the cell, a probe beam optical system introducing a probe beam including linearly polarized light component to the cell, a detection unit detecting a signal reflecting a rotation angle of a plane of polarization of the probe beam after intersecting with the pump beams, and an information acquisition unit acquiring information related to a magnetic field intensity of each of the different locations from the detected signal. The pump beam optical system includes a modulation unit modulating the pump beams so that one of frequencies and phases of the pump beams is different.


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