The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2019

Filed:

Mar. 28, 2017
Applicant:

SK Hynix Inc., Icheon-si, Gyeonggi-do, KR;

Inventors:

Tae Kyun Shin, Icheon-si Gyeonggi-do, KR;

Young Bo Shim, Dangjin-si Chungcheongnam-do, KR;

Assignee:

SK hynix Inc., Icheon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/317 (2006.01); G01R 31/3177 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31703 (2013.01); G01R 31/3177 (2013.01); G01R 31/31701 (2013.01); G01R 31/31722 (2013.01);
Abstract

A semiconductor device may be provided. The semiconductor device may include a latch comparison circuit configured for generating a latched address by latching a pattern signal inputted through an address, and generate a comparison signal by comparing a pattern signal inputted through the address and the latched address. The semiconductor device may include a failure flag generation circuit configured for generating a failure flag signal based on the comparison signal.


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