The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2019
Filed:
Nov. 30, 2016
Nokia Solutions and Networks Oy, Espoo, FI;
Nokia Solutions and Networks Oy, Espoo, FI;
Abstract
An apparatus includes a measurement structure for performing measurements of an RF device. The measurement structure includes an aperture in a conductive surface of the RF device and a conductive projecting region projecting into the aperture from a conductive perimeter of the aperture and electrically connected to that conductive perimeter. The aperture has a similar width in all dimensions. A combined shape of the aperture and the conductive projecting region does not possess even rotational symmetry about a point where a signal conductor will be placed on the conductive projecting region in order to conduct RF energy between the measurement structure and an external measurement instrument for performing the measurements. The measurement structure may be used for performing measurements of a multimode resonator, the measurements comprising one or more of resonant frequencies and quality factors of resonant modes of the resonator.