The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2019
Filed:
Jul. 07, 2017
Boe Technology Group Co., Ltd., Beijing, CN;
Hefei Xinsheng Optoelectronics Technology Co., Ltd., Hefei, Anhui, CN;
Zhun Wang, Beijing, CN;
Bisheng Li, Beijing, CN;
Zhenzhong Fang, Beijing, CN;
Xiaoyue He, Beijing, CN;
Wenjin Fan, Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD., Hefei, Anhui, CN;
Abstract
The present disclosure provides a touch structure, a test method thereof, a touch panel and a display apparatus. In the touch structure, by taking touch driving electrodes as an example, a plurality of third leads which are insulated from each other and are in one-to-one correspondence with various touch driving electrodes are additionally provided, wherein each of the third leads has one terminal electrically connected to a corresponding touch driving electrode and the other terminal serving as a test point for testing whether there is an open circuit on the corresponding touch driving electrode and the corresponding first lead. In this way, two probes may be placed at a test point in a third lead and a first wiring terminal in a binding area respectively when an open circuit test is conducted on each of the touch driving electrodes and a corresponding first lead.