The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2019

Filed:

Mar. 09, 2016
Applicant:

Haechitech Corporation, Cheongwon-gu, Chungcheongbuk-do, KR;

Inventors:

Dong Ho Kim, Cheongju-si, KR;

Sang Kyung Kim, Daejeon, KR;

Assignee:

Haechitech Corporation, Cheongju-si, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06D 1/00 (2006.01); G01P 15/105 (2006.01); G01P 15/18 (2013.01);
U.S. Cl.
CPC ...
G01P 15/105 (2013.01); G01P 15/18 (2013.01);
Abstract

According to one embodiment, a physical quantity measuring apparatus includes a signal measurer configured to include sensors configured to measure component values of two axes from among component values of three axes including an X(Hx), a Y(Hy) and a Z(Hz) measured component value of a physical quantity to be measured, a sensor controller configured to select one from among the sensors to be controlled to output a measured value from the selected sensor, an A/D transformer configured to transform an outputted signal selected by the sensor control unit into a digital signal, and a signal processor configured to receive the digital signal from the A/D transformer and to combine the received digital signal with other received digital signals to calculate X, Y and Z component values of the physical quantity.


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