The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2019
Filed:
Apr. 11, 2018
Konica Minolta, Inc., Chiyoda-ku, JP;
Takuma Morikawa, Sennan, JP;
Yasutaka Tanimura, Nara, JP;
Yasushi Goto, Sakai, JP;
Yusaku Kawahara, Osaka, JP;
Shinji Yamamoto, Sakai, JP;
KONICA MINOLTA, INC., Tokyo, JP;
Abstract
A reflection characteristic measurement system includes: a hand-held reflection characteristic measurement apparatus including a light receiver that receives reflected light; and a guide member that supports the reflection characteristic measurement apparatus, wherein the guide member includes: a plate-shaped support part having a support surface to support the reflection characteristic measurement apparatus; and a white calibration plate applicable to white calibration of the reflection characteristic measurement apparatus, the support part includes: an elongated hole extending in one direction along the support surface; and a guide structure provided to guide the reflection characteristic measurement apparatus so as to enable the apparatus to move along the one direction, the light receiver is provided on the reflection characteristic measurement apparatus so as to move along a predetermined moving path, the moving path of the light receiver extends in the one direction, and the white calibration plate is provided on the moving path.