The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2019
Filed:
Oct. 20, 2016
Hyperloop Technologies, Inc., Los Angeles, CA (US);
Jett Ferm, Los Angeles, CA (US);
James Coutre, Los Angeles, CA (US);
Ryan Okerson, Los Angeles, CA (US);
Cassandra Mercury, Pasadena, CA (US);
David Dehaan, Los Angeles, CA (US);
HYPERLOOP TECHNOLOGIES, INC., Los Angeles, CA (US);
Abstract
A testing apparatus includes a chamber, having an interior maintained at a predetermined pressure, a rotor rotatably disposed within the interior of the chamber, and a sensor disposed within the interior of the chamber. When the rotor rotates, the at least one sensor measures a testing characteristic of an object disposed within the interior of the chamber as the object interacts with the rotating rotor. A method includes setting a predetermined pressure of a chamber, rotating a rotor, and maintaining a gap between a surface of an object to be tested and a surface of the rotor by adjusting, with an actuator, the object to be tested or the rotor based upon a change, as measured by a laser, in the dimension of the object to be tested or the rotor.