The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2019

Filed:

Dec. 16, 2014
Applicant:

Nederlandse Organisatie Voor Toegepast—natuurwetenschappelijk Onderzoek Tno, The Hague, NL;

Inventors:

James Peter Robert Day, The Hague, NL;

Kees Moddemeijer, The Hague, NL;

Daniel Perez Calero, The Hague, NL;

Tom Duivenvoorde, The Hague, NL;

Marijn Sandtke, The Hague, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 3/02 (2006.01); G01J 3/18 (2006.01);
U.S. Cl.
CPC ...
G01J 3/2823 (2013.01); G01J 3/021 (2013.01); G01J 3/0208 (2013.01); G01J 3/0256 (2013.01); G01J 3/0291 (2013.01); G01J 3/18 (2013.01); G01J 3/1809 (2013.01);
Abstract

The present disclosure concerns a spectrometer () and method for generating a two dimensional spectrum (S). The spectrometer () comprises a main grating () and cross dispersion element (). An imaging mirror () is arranged for reflecting and focussing dispersed radiation (R) from the main grating () towards an image plane (IP) for imaging the two dimensional spectrum (S) onto an image plane (IP) of the spectrometer (). A correction lens () is arranged for correcting optical aberrations in the imaging of the two dimensional spectrum (S) in the image plane (IP). The imaging mirror () and correction lens () have a coinciding axis of cylindrical symmetry (AS).


Find Patent Forward Citations

Loading…