The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2019

Filed:

May. 25, 2017
Applicant:

Adom, Advanced Optical Technologies Ltd., Lod, IL;

Inventors:

Yoel Arieli, Jerusalem, IL;

Yosef Weitzman, Tel Aviv, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
G01B 9/0203 (2013.01); A61B 3/102 (2013.01); G01B 9/02032 (2013.01); G01B 9/02036 (2013.01); G01B 9/02043 (2013.01); G01B 9/02044 (2013.01); G01B 9/02057 (2013.01); G01B 9/02065 (2013.01); G01B 9/02091 (2013.01); G01B 2290/60 (2013.01);
Abstract

Apparatus and methods are described for optically analyzing an object having a plurality of layers, without needing to use a reference mirror. An extended broadband light source produces light, and directs the light toward the object, such as to create respective images of the light source on the respective layers of the object. An imaging system gathers light that is reflected from a point of the object into a conjugate point in the detector. The detector determines the thicknesses of the plurality of layers at the point of the object by analyzing, within the gathered light, interference between light reflected from the plurality of layers of the object at the point. Other applications are also described.


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