The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2019

Filed:

Aug. 07, 2015
Applicant:

Toyota Jidosha Kabushiki Kaisha, Toyota-shi, Aichi, JP;

Inventors:

Hirokazu Nishijima, Susono, JP;

Toru Kidokoro, Hadano, JP;

Makoto Ogiso, Mishima, JP;

Kazuya Takaoka, Gotemba, JP;

Assignee:

Toyota Jidosha Kabushiki Kaisha, Toyota-shi, Aichi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F01N 9/00 (2006.01); F01N 3/08 (2006.01); F01N 11/00 (2006.01); F01N 3/021 (2006.01); F01N 13/00 (2010.01); F01N 3/20 (2006.01);
U.S. Cl.
CPC ...
F01N 9/00 (2013.01); F01N 3/021 (2013.01); F01N 3/0842 (2013.01); F01N 3/0871 (2013.01); F01N 3/2066 (2013.01); F01N 11/00 (2013.01); F01N 11/007 (2013.01); F01N 13/009 (2014.06); F01N 2550/04 (2013.01); F01N 2560/05 (2013.01); F01N 2560/06 (2013.01); F01N 2560/07 (2013.01); F01N 2560/20 (2013.01); F01N 2900/1402 (2013.01); F01N 2900/1404 (2013.01); F01N 2900/1411 (2013.01); Y02T 10/47 (2013.01);
Abstract

In a failure diagnosis apparatus that carries out standard diagnosis processing in which a failure of the particulate filter is diagnosed by making a comparison between an output value of the PM sensor at the time when a predetermined period of time has passed from a point in time at which sensor regeneration processing for removing the particulate matter deposited on an insulation layer of the PM sensor has ended, and a predetermined threshold value, the standard diagnosis processing is carried out in the case where rich spike processing according to the in-cylinder rich control is not carried out during the predetermined period of time, whereas the rich spike processing according to the in-cylinder rich control is carried out during the predetermined period of time, the standard diagnosis processing is not carried out.


Find Patent Forward Citations

Loading…