The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2019

Filed:

Nov. 20, 2017
Applicants:

Masaya Kawarada, Kanagawa, JP;

Nobuyuki Satoh, Kanagawa, JP;

Suguru Yokozawa, Kanagawa, JP;

Kohta Aoyagi, Kanagawa, JP;

Kenta Sasaki, Kanagawa, JP;

Inventors:

Masaya Kawarada, Kanagawa, JP;

Nobuyuki Satoh, Kanagawa, JP;

Suguru Yokozawa, Kanagawa, JP;

Kohta Aoyagi, Kanagawa, JP;

Kenta Sasaki, Kanagawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/21 (2006.01); B41J 11/46 (2006.01); B41J 19/14 (2006.01); B41J 2/045 (2006.01); B41J 29/13 (2006.01); B41J 29/393 (2006.01);
U.S. Cl.
CPC ...
B41J 29/393 (2013.01); B41J 2/0458 (2013.01); B41J 2/04505 (2013.01); B41J 2/04581 (2013.01); B41J 2/2135 (2013.01); B41J 11/46 (2013.01); B41J 19/145 (2013.01); B41J 29/13 (2013.01); B41J 2029/3935 (2013.01);
Abstract

An imaging device includes an imaging unit to obtain a captured image of a test pattern and a reference mark to locate the test pattern and at least one processor. The test pattern includes a pair of first marks and a second mark. The processor includes a position detector configured to detect the reference mark in the captured image and locate the pair of first marks and the second mark in the captured image, and a ratio calculator configured to calculate one of a first ratio between a distance between the pair of first marks in the captured image and a deviation of the second mark in the captured image, and a second ratio between the distance between the pair of first marks in the captured image and a distance from one of the pair of first marks to the second mark in the captured image.


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