The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2019

Filed:

Jan. 12, 2018
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Brian Scott McCarthy, Schenectady, NY (US);

Subhrajit Roychowdhury, Schenectady, NY (US);

Mohammed Shalaby, Niskayuna, NY (US);

Victor Petrovich Ostroverkhov, Ballston Lake, NY (US);

Michael Evans Graham, Slingerlands, NY (US);

William Thomas Carter, Galway, NY (US);

Assignee:

GENERAL ELECTRIC COMPANY, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); B23K 26/042 (2014.01); B29C 64/393 (2017.01); B29C 64/245 (2017.01); G05B 19/401 (2006.01); B22F 3/105 (2006.01); B29C 64/268 (2017.01); B29C 64/153 (2017.01); B33Y 40/00 (2015.01);
U.S. Cl.
CPC ...
B23K 26/042 (2015.10); B22F 3/1055 (2013.01); B29C 64/153 (2017.08); B29C 64/245 (2017.08); B29C 64/268 (2017.08); B29C 64/393 (2017.08); G05B 19/4015 (2013.01); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 40/00 (2014.12); B33Y 50/02 (2014.12);
Abstract

An additive manufacturing system including a consolidation device, a build platform, an optical detector, and a controller is provided. The consolidation device is configured to form a build layer of a component. The build platform is configured to rotate about a build platform rotation axis extending along a first direction. The optical detector is configured to detect locations of at least two alignment marks. The controller is configured to receive locations of the at least two alignment marks from the optical detector. The controller is also configured to determine the locations of the build platform rotation axis and a build platform rotation center point based on a comparison between the at least two alignment marks, wherein the build platform rotation center point lies along the build platform rotation axis. The controller is further configured to control the consolidation device to consolidate a plurality of particles on the build platform.


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