The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2019

Filed:

Feb. 04, 2016
Applicant:

Queen's University AT Kingston, Kingston, CA;

Inventors:

Hossein Sadjadi, Kingston, CA;

Elodie Lugez, Kingston, CA;

Keyvan Hashtrudi-Zaad, Kingston, CA;

Gabor Fichtinger, Kingston, CA;

Assignee:

Queen's University at Kingston, Kingston, Ontario, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/20 (2006.01); A61B 34/10 (2016.01); A61B 34/20 (2016.01); G01D 18/00 (2006.01); A61B 17/34 (2006.01); A61B 34/30 (2016.01);
U.S. Cl.
CPC ...
A61B 34/10 (2016.02); A61B 34/20 (2016.02); G01D 18/008 (2013.01); A61B 34/30 (2016.02); A61B 2017/3413 (2013.01); A61B 2034/102 (2016.02); A61B 2034/107 (2016.02); A61B 2034/2051 (2016.02); A61B 2034/2055 (2016.02);
Abstract

An apparatus for electromagnetic (EM) tracking or localization is described which includes one or more EM transmitters and receivers (sensors, or trackers), an indication of relative locations of the one or more transmitter and sensor with respect to one or more instrument, optionally, a model of the one or more instrument flexibility, a measurement uncertainty analyzer that reports an uncertainty associated with each measurement, an equation of motion or dynamic model with motion constraints that describes an expected behavior of the one or more instrument, a probabilistic simultaneous localization and mapping (SLAM) algorithm that simultaneously estimates a pose of one or more instrument and updates a field distortion map, or parameters of a field distortion model, a field distortion estimator that uses currently-available information of the field distortion map and estimates field distortion in the vicinity of the one or more instrument, to be used for future measurement compensation, a transient analyzer that constantly observes variations in the field distortion map over time in order to differentiate regions with continuous changes from regions with constant field distortion, and provides feedback to the field distortion estimator, including indicating to what degree each region of the map is expected to change, wherein simultaneous field distortion mapping and electromagnetic tracking or localization of the one or more instrument is provided in real time.


Find Patent Forward Citations

Loading…