The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2019
Filed:
Nov. 02, 2016
Anton Nekovar, Neunkirchen, DE;
Tamás Ujvári, Forchheim, DE;
Anton Nekovar, Neunkirchen, DE;
Tamás Ujvári, Forchheim, DE;
Siemens Healthcare GmbH, Erlangen, DE;
Abstract
The embodiments relate to a method for adapting at least one radiation parameter of a beam source in an x-ray device, wherein the beam source is activated according to the radiation parameter for providing x-radiation, wherein, as long as the filter element is not being moved, the radiation parameter is specified based on image data acquired in a transillumination region by the beam detector, wherein at least one interim image is recorded at least partially within a movement interval during which the filter element is moved, after which the radiation parameter is specified independently of the image data of the interim image or after which exclusively image data of the interim image that are acquired in an overlapping region of the beam detector that lies within the transillumination region during the entire recording interval are taken into account in the determination of the radiation parameter.