The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2019
Filed:
Jul. 01, 2014
School Juridical Person Kitasato Institute, Tokyo, JP;
Satoru Nebuya, Sagamihara, JP;
So Hifumi, Sagamihara, JP;
SCHOOL JURIDICAL PERSON KITASATO INSTITUTE, Tokyo, JP;
Abstract
An electrical impedance tomography (EIT) measurement device () includes a measurement belt () to which a plurality of electrode pads arranged in a row and a plurality of strain gauges arranged in parallel to the plurality of electrode pads are integrally adhered and configured to be used after being wrapped around a portion (X) serving as a measurement target of a living body, an EIT measurement control unit configured to acquire a tomographic image of the portion (X) serving as the measurement target while applying a current to the plurality of electrode pads and acquiring a voltage signal generated between the electrode pads, and a contour estimation unit configured to estimate a contour shape of the portion serving as the measurement target and a size of the contour shape on the basis of curvature data acquired via the strain gauge.