The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2019

Filed:

Nov. 05, 2010
Applicants:

John M. Schweitzer, Geneseo, IL (US);

Jason D. Walter, Davenport, IA (US);

James R. Peterson, Annawan, IL (US);

Inventors:

John M. Schweitzer, Geneseo, IL (US);

Jason D. Walter, Davenport, IA (US);

James R. Peterson, Annawan, IL (US);

Assignee:

DEERE & COMPANY, Moline, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06F 19/00 (2018.01); A01C 7/00 (2006.01); A01C 7/10 (2006.01); A01B 79/00 (2006.01);
U.S. Cl.
CPC ...
A01C 7/105 (2013.01); A01B 79/005 (2013.01);
Abstract

A seeding apparatus and a method is disclosed in which a seed spacing variability value is determined and displayed to the operator during a planting operation. Any method of determining variability among a set of data can be used to determine the seed spacing variability value. Three examples are shown: standard deviation; coefficient of variation; and coefficient of uniformity. Data can be stored for later comparison with harvest yield data to determine the effects of seed spacing on yield.


Find Patent Forward Citations

Schweitzer, John. (2019). Seeding apparatus and method of determining a seed spacing variability value (U.S. Patent No. 10285325). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10285325

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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