The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2019
Filed:
Jul. 29, 2016
Applicant:
Zt Group Int'l, Inc., Secaucus, NJ (US);
Inventor:
Ting Yu Lin, Bloomfield, NJ (US);
Assignee:
ZT Group Int'l, Inc., Secaucus, NJ (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H05K 7/20 (2006.01); G01N 19/10 (2006.01); G01F 1/76 (2006.01); G01K 7/02 (2006.01);
U.S. Cl.
CPC ...
H05K 7/20136 (2013.01); G01F 1/76 (2013.01); G01K 7/02 (2013.01); G01N 19/10 (2013.01); H05K 7/20145 (2013.01);
Abstract
A rack test room is disclosed that provides a controlled and monitored environment for one or more server racks, the room controlling and monitoring the cold aisle temperature, the cold aisle air inlet flow rate, and the hot aisle temperature. A rack test room is disclosed that monitors the inlet and exhaust air temperatures for each server in a rack. A rack test room is disclosed that individually controls and monitors the inlet air flow rate to each of a plurality of server racks. A method is disclosed for using a rack test room to simulate a data center environment.