The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2019

Filed:

Sep. 08, 2015
Applicant:

Uber Technologies, Inc., San Francisco, CA (US);

Inventors:

Franziska Bell, San Francisco, CA (US);

David Purdy, Millbrae, CA (US);

Laszlo Korsos, San Francisco, CA (US);

Shan He, San Francisco, CA (US);

Assignee:

UBER TECHNOLOGIES, INC., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); H04L 12/26 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
H04L 43/16 (2013.01); H04L 41/064 (2013.01); H04L 41/069 (2013.01); H04L 41/0622 (2013.01);
Abstract

An event analysis system receives events in a time-series from a set of monitored systems and identifies a set of alert threshold values for each of the types of events to identify outliers in the time-series at an evaluated time. Portions of historic event data is selected to identify windows of event data near the evaluated time at a set of seasonally-adjusted times to predict the value of the event type. The alert threshold value may also account for a prediction based on recent, higher-frequency events. Using the alert threshold values for a plurality of event types, the event data is compared with the alert threshold values to determine an alert level for the data. The event data types are also clustered and displayed with the alert levels to provide a visualization of the event data and identify outliers when the new event data is received.


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