The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2019

Filed:

Aug. 01, 2016
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Md. Abidur Rahman, Richardson, TX (US);

Adam Quirk, Dallas, TX (US);

Stephen Nortman, Dallas, TX (US);

Sualp Aras, Dallas, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H02H 3/00 (2006.01); H03K 17/082 (2006.01); H02H 5/04 (2006.01); H02H 3/06 (2006.01); H03K 17/08 (2006.01);
U.S. Cl.
CPC ...
H03K 17/0822 (2013.01); H02H 3/00 (2013.01); H02H 3/06 (2013.01); H02H 5/041 (2013.01); H03K 2017/0806 (2013.01);
Abstract

A circuit protective system. The system includes an output controlling enablement of a transistor and an input sensing an operational parameter associated with the transistor. The system also includes detection circuitry providing an event fault indicator if the operational parameter violates a condition. The system also includes protective circuitry disabling the transistor in response to the event fault indicator and subsequently selectively applying an enabling bias to the transistor; the enabling bias is selected from at least two different bias levels and in response to a number of event fault indications from the detection circuitry.


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