The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2019

Filed:

Sep. 06, 2016
Applicants:

Steven R. J. Brueck, Albuquerque, NM (US);

Sanjay Krishna, Albuquerque, NM (US);

Seung-chang Lee, Albuquerque, NM (US);

Inventors:

Steven R. J. Brueck, Albuquerque, NM (US);

Sanjay Krishna, Albuquerque, NM (US);

Seung-Chang Lee, Albuquerque, NM (US);

Assignee:

STC.UNM, Albuquerque, NM (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/00 (2006.01); G02B 6/122 (2006.01); H01L 31/109 (2006.01); H01L 31/0236 (2006.01); H01L 31/0232 (2014.01); H01L 31/18 (2006.01); H01L 31/0304 (2006.01); H01L 31/0352 (2006.01); H01L 31/0224 (2006.01); H01L 31/105 (2006.01); H01L 31/0336 (2006.01);
U.S. Cl.
CPC ...
H01L 31/184 (2013.01); G02B 5/008 (2013.01); G02B 6/1226 (2013.01); H01L 31/02327 (2013.01); H01L 31/02363 (2013.01); H01L 31/022408 (2013.01); H01L 31/0304 (2013.01); H01L 31/0336 (2013.01); H01L 31/035218 (2013.01); H01L 31/035236 (2013.01); H01L 31/105 (2013.01); H01L 31/109 (2013.01); H01L 31/03046 (2013.01); H01L 31/1844 (2013.01);
Abstract

The present disclosure relates to an electromagnetic energy detector. The detector can include a substrate having a first refractive index; a metal layer; an absorber layer having a second refractive index and disposed between the substrate and the metal layer; a coupling structure to convert incident radiation to a surface plasma wave; additional conducting layers to provide for electrical contact to the electromagnetic energy detector, each conducting layer characterized by a conductivity and a refractive index; and a surface plasma wave ('SPW') mode-confining layer having a third refractive index that is higher than the second refractive index disposed between the substrate and the metal layer.


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