The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2019

Filed:

Nov. 29, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Michael B. Healy, Cortlandt Manor, NY (US);

Hillery C. Hunter, Chappaqua, NY (US);

Janani Mukundan, Austin, TX (US);

Karthick Rajamani, Austin, TX (US);

Saravanan Sethuraman, Bangalore, IN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/12 (2006.01); G11C 29/50 (2006.01); G11C 29/52 (2006.01); G11C 14/00 (2006.01); G11C 11/16 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G11C 29/12 (2013.01); G11C 14/0036 (2013.01); G11C 29/12005 (2013.01); G11C 29/50004 (2013.01); G11C 29/50012 (2013.01); G11C 29/52 (2013.01); G11C 11/1673 (2013.01); G11C 11/1675 (2013.01); G11C 2029/0401 (2013.01); G11C 2029/5004 (2013.01);
Abstract

Examples of techniques for a built-in self-test (BIST) for embedded spin-transfer torque magnetic random access memory (STT-MRAM) are disclosed. In one example implementation according to aspects of the present disclosure, a computer-implemented method may include: initiating, by a processor, a BIST for the STT-MRAM; performing, by the processor, an error-correcting code (ECC) test for a portion of the STT-MRAM; responsive to the ECC test not being passed, determining whether a maximum signal is reached; responsive to the maximum signal not being reached, increasing the signal and performing the ECC test again; and responsive to the maximum signal being reached, determining that the portion of the STT-MRAM is bad.


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