The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2019
Filed:
Jul. 21, 2016
Educational Testing Service, Princeton, NJ (US);
Zhou Yu, Pittsburgh, PA (US);
Vikram Ramanarayanan, San Francisco, CA (US);
David Suendermann-Oeft, San Francisco, CA (US);
Xinhao Wang, San Francisco, CA (US);
Klaus Zechner, Princeton, NJ (US);
Lei Chen, Lawrenceville, NJ (US);
Jidong Tao, Lawrenceville, NJ (US);
Yao Qian, San Francisco, CA (US);
Educational Testing Service, Princeton, NJ (US);
Abstract
Systems and methods are provided for a processor-implemented method of analyzing quality of sound acquired via a microphone. An input metric is extracted from a sound recording at each of a plurality of time intervals. The input metric is provided at each of the time intervals to a neural network that includes a memory component, where the neural network provides an output metric at each of the time intervals, where the output metric at a particular time interval is based on the input metric at a plurality of time intervals other than the particular time interval using the memory component of the neural network. The output metric is aggregated from each of the time intervals to generate a score indicative of the quality of the sound acquired via the microphone.