The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2019
Filed:
Aug. 12, 2016
General Electric Company, Schenectady, NY (US);
Hariharan Ravishankar, Bangalore, IN;
Ravindra Mohan Manjeshwar, Solon, OH (US);
Floribertus PM Heukensfeldt Jansen, Ballston Lake, NY (US);
Michel Souheil Tohme, Waukesha, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
According to one embodiment, a method of image analysis is provided. The method includes binning image data into a plurality of sinogram frames, identifying a plurality of initial stationary frames by applying a first analysis technique on the plurality of binned sinogram frames, extracting a plurality of first statistical parameters applying a second analysis technique on the plurality of binned sinogram frames, combining the plurality of first statistical parameters with boundaries of plurality of initial stationary frames to generate a presentation of a joint analysis combining at least some of the plurality of the first statistical parameters and at least some of the plurality of the second statistical parameter, identifying a plurality of final stationary frames from the presentation of the joint analysis, independently reconstructing each of the plurality of final stationary frames, and registering each of the plurality of final stationary frames to a first state.