The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2019
Filed:
Mar. 30, 2016
Boe Technology Group Co., Ltd., Beijing, CN;
Boe (Hebei) Mobile Display Technology Co., Ltd., Hebei, CN;
Guowen Yang, Beijing, CN;
Yongjun Liao, Beijing, CN;
Zhen Wu, Beijing, CN;
Dongnian Han, Beijing, CN;
Jiayin Wang, Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
BOE (HEBEI) MOBILE DISPLAY TECHNOLOGY CO., LTD., Hebei, CN;
Abstract
The present disclosure provides an apparatus and system for testing a touch screen, and an apparatus for controlling test of a touch screen. The apparatus for testing a touch screen comprises: a processor, a test signal collection interface unit, and an external communication interface unit, wherein the processor is connected to the test signal collection interface unit, and is configured to, after touch information is collected by the test signal collection interface unit, convert the collected touch information into a format which is recognizable by an intelligent device, and transmit the converted touch information to the intelligent device through the external communication interface unit. The apparatus for testing a touch screen according to the present disclosure enables the touch information to be correspondingly processed and displayed by a processor and a display of the intelligent device, respectively. In this way, as the processor of the apparatus for testing a touch screen per se needs not to perform corresponding data processing and analysis processes, a processor with low performance may be used to facilitate reducing the manufacturing cost of the apparatus for testing a touch screen.