The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2019

Filed:

Dec. 31, 2015
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Owen Martin, Hopedale, MA (US);

Hui Wang, Upton, MA (US);

Jaeyoo Jung, Shrewsbury, MA (US);

James L. Davidson, Tyngsboro, MA (US);

Jeffrey Wilson, Franklin, MA (US);

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0611 (2013.01); G06F 3/0647 (2013.01); G06F 3/0673 (2013.01);
Abstract

Described are techniques for controlling I/O response time. It is determined whether a first observed I/O response time for a storage group exceeds I/O performance specified by a service level objective. If so, first processing may be performed to decrease I/O performance for the storage group. The first processing may include: for each I/O directed to the storage group that is received within a first subsequent time period, determining a first response time denoting an amount of time taken to service each I/O prior to returning a response for each I/O; determining whether the first response time for each I/O is less than a response time delay threshold; and if the first response time for each I/O is less than the response time delay threshold, applying a response time delay to each I/O prior to returning a response for each I/O.


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