The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2019
Filed:
May. 29, 2017
Olympus Corporation, Hachioji-shi, Tokyo, JP;
Shintaro Takahashi, Tokyo, JP;
Tadashi Hirata, Tokyo, JP;
Yasunobu Iga, Tokyo, JP;
Shinichi Takimoto, Tokyo, JP;
Takashi Miyoshi, Kanagawa, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
Provided is an observation apparatus and an observation method with which it is possible to observe imaging subjects, such as cells or the like, without labeling the imaging subjects and without causing an increase in the apparatus size. Provided is an observation apparatus including: a light-source unit that emits illumination light upward from below a sample; and an image-capturing optical system that has an objective lens that collects transmitted light, which is the illumination light emitted from the light-source unit that has passed through the sample by being reflected above the sample and that captures, below the sample, the transmitted light collected by the objective lens.