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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10281699 B1

PDFFull Text
Date of Patent:
May. 07, 2019

Filed:

Aug. 23, 2017

Microscope system configured to irradiate focused light onto an area of a specimen outside of an optical axis of an objective lens

Applicant:

Olympus Corporation, Hachioji-shi, Tokyo, JP;

Inventors:

Tatsuo Nakata, Tokyo, JP;

Atsushi Doi, Tokyo, JP;

Kentaro Imoto, Tokyo, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:

Holtz, Holtz & Volek PC

Primary Examiner:

Frank G Font

Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/06 (2006.01); G02B 21/24 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0032 (2013.01); G02B 21/0044 (2013.01); G02B 21/0048 (2013.01); G02B 21/06 (2013.01); G02B 21/24 (2013.01);
Abstract

A microscope system includes an objective lens that focuses, on a specimen, illumination light produced by a light source. An illumination-area switching mechanism is disposed between the objective lens and the specimen and switches an illumination area irradiated with the illumination light focused by the objective lens among a plurality of illumination areas on the specimen that are located outside an objective optical axis of the objective lens. An inner focus lens is disposed on the objective optical axis between the light source and the objective lens and changes a focus position of the objective lens in a direction along the objective optical axis.

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Nakata, Tatsuo. (2019). Microscope system configured to irradiate focused light onto an area of a specimen outside of an optical axis of an objective lens (U.S. Patent No. 10281699). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10281699

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