The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2019

Filed:

Nov. 30, 2016
Applicants:

Francis T. Mcquade, Hutto, TX (US);

Raul Ramon Molina, Iv, Hutto, TX (US);

Michael Chrastecky, Hutto, TX (US);

Inventors:

Francis T. McQuade, Hutto, TX (US);

Raul Ramon Molina, IV, Hutto, TX (US);

Michael Chrastecky, Hutto, TX (US);

Assignee:

TRANSLARITY, INC., Fremont, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/20 (2006.01); G01R 1/073 (2006.01); G01R 3/00 (2006.01); G01R 31/26 (2014.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 1/07342 (2013.01); G01R 1/07357 (2013.01); G01R 1/07371 (2013.01); G01R 3/00 (2013.01); G01R 31/2601 (2013.01); G01R 31/2891 (2013.01);
Abstract

A probe card is disclosed. The probe card includes a first disc, a second disc, an alignment plate and multiple micro probes. One of the micro probes includes a linear segment and a curved segment connected to each other at an angle stop. The first disc includes a recessed area having multiple holes formed therein, wherein one of the holes is configured to receive the linear segment of the micro probe. The second disc includes a recessed area having multiple holes formed therein, wherein one of the holes is configured to receive the curved segment of the micro probe. Placed within the recessed area of the second disc, the alignment plate includes multiple holes formed therein, wherein one of the holes is configured to receive the curved segment of the micro probe.


Find Patent Forward Citations

McQuade, Francis. (2019). Probe card for testing semiconductor wafers (U.S. Patent No. 10281491). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10281491

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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