The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2019
Filed:
Jun. 01, 2018
Recursion Pharmaceuticals, Inc., Salt Lake City, UT (US);
Mason L. Victors, Salt Lake City, UT (US);
Blake C. Borgeson, Salt Lake City, UT (US);
Cedric St-Jean-Leblanc, Montreal, CA;
Recursion Pharmaceuticals, Inc., Salt Lake City, UT (US);
Abstract
A method for determining whether a set of perturbations discriminates over a null distribution for an on target effect against a first component of an entity is provided. The set of perturbations comprises perturbations of the first component and the entity comprises components including the first component. There is obtained, for each respective perturbation, a corresponding vector, thereby obtaining a plurality of vectors. Each such vector comprises a plurality of elements. Each element comprises (i) a distribution metric of a different feature, in a plurality of features, across a plurality of instances of the entity upon exposure of the plurality of instances of the entity to the respective perturbation or (ii) a distribution metric of a respective dimension reduction component computed using the plurality of features for a plurality of instances of the entity upon exposure of the plurality of instances of the entity to the respective perturbation.