The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2019

Filed:

Sep. 24, 2015
Applicant:

Applied Spectra, Inc., Fremont, CA (US);

Inventors:

Richard E. Russo, Walnut Creek, CA (US);

Jong Hyun Yoo, Dublin, CA (US);

Chunyi Liu, Fremont, CA (US);

Assignee:

Other;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/71 (2006.01); G01N 33/02 (2006.01); G01J 3/443 (2006.01); G01N 21/85 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
G01N 21/718 (2013.01); G01J 3/443 (2013.01); G01N 21/85 (2013.01); G01N 33/02 (2013.01); G01N 2021/845 (2013.01);
Abstract

A method and apparatus for analyzing one or more elements of targeted moving food surfaces uses laser-induced breakdown spectroscopy to detect the presence, absence, or amount of an element on a heterogeneous surface of an object, including surfaces of food products. A laser is used to quantify an element concentration without destroying the object. The method can be configured to include an automated on-line system comprising a closed-loop feedback control system operable to select a predetermined concentration.


Find Patent Forward Citations

Russo, Richard. (2019). Method for elemental analysis in a production line (U.S. Patent No. 10281406). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10281406

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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