The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2019
Filed:
Dec. 09, 2016
Applicant:
Rapiscan Systems, Inc., Torrance, CA (US);
Inventors:
James P. Bilodeau, Gardner, MA (US);
Thomas A. Hagerty, Melrose, MA (US);
Assignee:
Rapiscan Systems, Inc., Torrance, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/20 (2006.01); G01N 1/02 (2006.01);
U.S. Cl.
CPC ...
G01N 1/02 (2013.01); G01N 2001/022 (2013.01); G01N 2001/028 (2013.01);
Abstract
The present disclosure includes a sampling device for collecting a sample from a target surface, the sample device including a handle, a body extending from the handle, and a mechanical force feedback mechanism. The mechanical force feedback mechanism is configured to change an orientation of the body relative to the handle when force is applied to a target surface by the sampling device.