The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2019

Filed:

Dec. 29, 2015
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Tsung-Jung Hsieh, Tainan, TW;

Sen-Chia Chang, Hsinchu, TW;

Yao-Chung Hsu, Yunlin County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 99/00 (2011.01); G06F 17/11 (2006.01);
U.S. Cl.
CPC ...
G01M 99/005 (2013.01); G06F 17/11 (2013.01);
Abstract

A breakdown measuring method and a breakdown measuring device are disclosed. The breakdown measuring method includes the following steps: capturing a plurality of process flows, each of the process flows includes at least one recipe step; analyzing a flow attribute corresponding to each of the process flows; capturing sensing data corresponding to the at least one recipe step; generating a local feature in a time interval corresponding to each of the process flows according to the corresponding flow attribute, the corresponding at least one recipe step and the corresponding sensing data; generating a trend distribution according to the local features of the process flows; determining whether to send an alarm information based on the trend distribution.


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