The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2019
Filed:
Oct. 08, 2015
Consejo Superior DE Investigaciones Cientificas, Madrid, ES;
Valerio Pini, Madrid, ES;
Priscila Monteiro Kosaka, Madrid, ES;
Francisco Javier Tamayo De Miguel, Madrid, ES;
Montserrat Calleja Gomez, Madrid, ES;
Daniel Ramos Vega, Madrid, ES;
Oscar Malvar Vidal, Madrid, ES;
Jose Jaime Ruz Martinez, Madrid, ES;
Mario Encinar Del Pozo, Madrid, ES;
CONSEJO SUPERIOR DE INVESTIGACIONES CIENTIFICAS, Madrid, ES;
Abstract
The invention relates to a spectrophotometer, especially a spectrophotometer that can carry out simultaneous analysis at different points on the same sample (), with a high spatial resolution and without requiring a mechanical system for physical scanning along the sample. This is obtained by the provision of means for processing the light received by the photodetectors (), said processing means having a correlation wherein each of the photodetectors () corresponds to a spatial point on the sample (). In the case of dark field applications, the present invention ensures the standardization of the data using the same measure.