The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2019
Filed:
Nov. 25, 2015
Canon Kabushiki Kaisha, Tokyo, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
A three-dimensional measurement apparatus including: a projection unit configured to project a pattern onto a measurement target object from one or more projection directions; and an image capturing unit configured to obtain one or more captured images by capturing an image of the measurement target object from one or more view points. The three-dimensional measurement apparatus obtains a position of the pattern projected onto the measurement target object based on the one or more captured images obtained by the image capturing unit, and calculates three-dimensional coordinates of a surface of the measurement target object based on the position of the pattern obtained from the one or more captured images and a position of the pattern estimated based on a parameter set that represents internal scattering of the measurement target object.