The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2019
Filed:
Aug. 25, 2017
Ming Chuan University, Taipei, TW;
Chung-Lin Chia, Taoyuan, TW;
Chaur-Heh Hsieh, Taipei, TW;
Ming Chuan University, Taipei, TW;
Abstract
A block-base error measure method for object segmentation includes the steps of dividing a reference image having an object into plural non-overlapping blocks, superimposing the reference image with a segmented image to obtain an error ratio of the block to define an enhanced equation and a modification equation to suppress the scattered error and enhance the contribution of the region error, so as to calculate the error amount of the segmented image and evaluate the performance of image segmentation. Compared with the conventional error measure method based on pixels, the present invention provides a more accurate high-level semantic.