The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2019

Filed:

Dec. 18, 2015
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Khawar Ali, Los Angeles, CA (US);

Kevin Michael Davis, Seattle, WA (US);

Krishnan Ananthanarayanan Kolazhi, Bellevue, WA (US);

Onkar Bhaskar Walavalkar, Seattle, WA (US);

Assignee:

AMAZON TECHNOLOGIES, INC., Seattle, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
H04L 67/28 (2013.01); H04L 43/0888 (2013.01);
Abstract

Described are techniques for determining relationships between related processes and, based on the relationships, determining a critical path for at least a subset of the processes. The critical path for a process may be identified by determining whether a process is able to execute after each input received by the process. When the process is able to execute, the preceding process that provided the latest-received input may be identified. The process may be repeated for one or more preceding processes until a root process is determined. Based on the critical path data for a process, changes in latency due to a change in the critical path, a change in latency for an existing process, or the addition of a new process may be determined.


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