The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2019
Filed:
Nov. 10, 2016
Contec, Llc, Schenectady, NY (US);
Rajeev Tiwari, San Jose, CA (US);
Mrinal Mathur, San Jose, CA (US);
Contec, LLC, Schenectady, NY (US);
Abstract
A system may include a master test system and a plurality of slave test systems coupled to the master test system and/or each other. The system may include devices under test (DUTs) (also referred to herein as units under test (UUTs)) stored in test slots and coupled to the master test system or specific slave test systems over Ethernet, coaxial, or other cables. Each test slot may include a Faraday cage that shields the contents therein from electromagnetic signals outside the test slot. The master test system and/or the slave test systems may test the DUTs using specific sequences of tests according to testing protocols relevant to those DUTs. One or more test controllers, mobile devices, display devices, and/or input devices may be coupled to the test systems and be used to control specific test protocols performed by the test systems.