The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2019

Filed:

Mar. 14, 2018
Applicant:

Resonant Inc., Santa Barbara, CA (US);

Inventors:

James R. Costa, Lompoc, CA (US);

Balam Quitzé Andrés Willemsen Cortés, Lexington, MA (US);

Assignee:

Resonant Inc., Goleta, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03H 9/64 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
H03H 9/6483 (2013.01); G06F 17/5063 (2013.01); G06F 17/5081 (2013.01); H03H 2260/00 (2013.01);
Abstract

Methods to design band-pass acoustic wave microwave filters are disclosed. A performance metric related to an input impedance of a baseline filter design is calculated, the baseline filter design including a plurality of series surface acoustic wave resonators and a plurality of shunt surface acoustic wave resonators, each surface acoustic wave resonator having a respective resonant frequency. One or more alternative filter designs is established, each alternative filter design derived from the baseline filter design by reordering the resonant frequencies of two or more of the plurality of series surface acoustic wave resonators and/or two or more of the plurality of shunt surface acoustic wave resonators. A respective performance metric related to an input impedance of each alternative filter designs is calculated. A final filter design is selected from among the baseline filter design and the alternative filter designs based on the respective performance metrics.


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