The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2019

Filed:

Apr. 28, 2016
Applicant:

Mitsui Mining & Smelting Co., Ltd., Tokyo, JP;

Inventors:

Tetsuya Mitsumoto, Takehara, JP;

Kyohei Yamaguchi, Takehara, JP;

Toshikazu Matsuyama, Takehara, JP;

Hideaki Matsushima, Takehara, JP;

Shinya Kagei, Takehara, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01B 1/08 (2006.01); H01M 4/00 (2006.01); C01G 53/00 (2006.01); H01M 4/505 (2010.01); H01M 4/36 (2006.01); H01M 10/052 (2010.01); C01G 49/00 (2006.01); C01G 51/00 (2006.01); H01M 4/525 (2010.01); H01M 4/02 (2006.01);
U.S. Cl.
CPC ...
H01M 4/505 (2013.01); C01G 49/009 (2013.01); C01G 51/54 (2013.01); C01G 53/44 (2013.01); C01G 53/54 (2013.01); C01G 53/70 (2013.01); H01B 1/08 (2013.01); H01M 4/362 (2013.01); H01M 10/052 (2013.01); C01P 2002/32 (2013.01); C01P 2002/60 (2013.01); C01P 2002/72 (2013.01); C01P 2004/62 (2013.01); C01P 2006/10 (2013.01); C01P 2006/11 (2013.01); C01P 2006/12 (2013.01); C01P 2006/80 (2013.01); C01P 2006/82 (2013.01); H01M 4/525 (2013.01); H01M 2004/028 (2013.01); Y02T 10/7011 (2013.01);
Abstract

Provided is a new 5 V-class spinel-type lithium-manganese-containing composite oxide capable of achieving both the expansion of a high potential capacity region and the suppression of gas generation. Proposed is the spinel-type lithium-manganese-containing composite oxide comprising Li, Mn, O and two or more other elements, and having an operating potential of 4.5 V or more at a metal Li reference potential, wherein a peak is present in a range of 14.0 to 16.5° at 2θ, in an X-ray diffraction pattern measured by a powder X-ray diffractometer (XRD) using CuKα1 ray.


Find Patent Forward Citations

Loading…