The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2019

Filed:

Jun. 27, 2014
Applicant:

Erich Thallner, St. Florian, AT;

Inventor:

Erich Thallner, St. Florian, AT;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/687 (2006.01); B32B 43/00 (2006.01); H01L 21/67 (2006.01); H01L 21/683 (2006.01); B32B 37/08 (2006.01);
U.S. Cl.
CPC ...
H01L 21/67092 (2013.01); B32B 37/08 (2013.01); B32B 43/006 (2013.01); H01L 21/67103 (2013.01); H01L 21/6835 (2013.01); H01L 21/68714 (2013.01); B32B 2309/105 (2013.01); B32B 2457/00 (2013.01); H01L 21/6836 (2013.01); H01L 2221/6834 (2013.01); H01L 2221/68318 (2013.01); H01L 2221/68327 (2013.01); H01L 2221/68381 (2013.01); H01L 2221/68386 (2013.01); Y10S 156/93 (2013.01); Y10S 156/941 (2013.01); Y10T 156/1153 (2015.01); Y10T 156/1189 (2015.01); Y10T 156/1911 (2015.01); Y10T 156/1972 (2015.01);
Abstract

A method and device for detaching a first substrate, which is connected to a second substrate by an interconnect layer, from the second substrate by embrittlement of the interconnect layer. A method for bonding of a first substrate to a second substrate with an interconnect layer which can be embrittled by cooling. A use of a material which can be embrittled for producing an interconnect layer between first and second substrates for forming a substrate stack. A substrate stack, formed from a first substrate, a second substrate and an interconnect layer located therebetween, the interconnect layer formed from a material which can be embrittled. A wafer chuck for holding a first substrate when the first substrate is being detached from a second substrate with fixing means which can be activated by lowering the temperature.


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